Other
Start Date
End Date
ENG
Matter
Summary
ENG
ENG
ENG
ENG
ENG
ENG
ENG
ENG
Basic information
Name
SATOH Toshifumi
Start Date
2005-11
End Date
 
ENG
ENG
Matter
Relationship between Hot-Carrier Degradation and Electric Field in Low-Temparature Processed N-Channel Poly-Si TFT””
Summary
 
ENG
ENG
The 2nd Thin Film Materials & Devices Meeting
ENG
G.Usami、 Y.Nogami、 T.Yajima、 T.Satoh and H.Tango
ENG
 
ENG
 
ENG
奈良
ENG
2005
ENG