2005/11

学会発表（国内学会）

Relationship between Hot-Carrier Degradation and Electric Field in Low-Temparature Processed N-Channel Poly-Si TFT””

The 2nd Thin Film Materials & Devices Meeting

G.Usami、 Y.Nogami、 T.Yajima、 T.Satoh and H.Tango

奈良

2005