2003-06

ENG

Hot-carrier-Induced Degradation of Threshold Voltage under Strong and Weak Current Saturation Stress in p-Channel Low-Temperature Poly-Si TFTs

2003 International Workshop on Active-Matrix Liquid- crystalDisplays (AM-LCD 2003)、 Digest of Technical Papers 、

M. Suganuma、 T. Satoh and H. Tango、

2003