作品・発表
|
|
2003/06
学会発表（海外・国際学会）
Hot-carrier-Induced Degradation of Threshold Voltage under Strong and Weak Current Saturation Stress in p-Channel Low-Temperature Poly-Si TFTs
2003 International Workshop on Active-Matrix Liquid- crystalDisplays (AM-LCD 2003)、 Digest of Technical Papers 、
M. Suganuma、 T. Satoh and H. Tango、
2003
|
