2005-07

ENG

Hot-Carrier Degradation and Electric Field near Drain Junction in Low-Temperature N-Vhannel SD (single drain) and LDD Poly-Si TFTs

The 13th International Workshop on Active-Matrix Flatpanel Displays and Devices

G. Usami、 Y. Nogami、 T. Yajima、 M. Yamagata、 T. Satoh、 H. Tango

東京

2006