作品・発表
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2005/07
学会発表（国内学会）
Hot-Carrier Degradation and Electric Field near Drain Junction in Low-Temperature N-Vhannel SD (single drain) and LDD Poly-Si TFTs
The 13th International Workshop on Active-Matrix Flatpanel Displays and Devices
G. Usami、 Y. Nogami、 T. Yajima、 M. Yamagata、 T. Satoh、 H. Tango
東京
2006
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