Academic Theses
Title
Summary
ENG
ENG
ENG
Date of Issue
Magazine(name)
Volume
Page
ENG
ENG
ENG
Basic information
Name
SATOH Toshifumi
Title
Hot-Carrier-Induced Degradation under Current Saturation Bias in p-Channel Low-Temperature Polycrystalline Silicon Thin-Film Transistors
Summary
 
ENG
ENG
ENG
ENG
M. Yamagata_ T. Satoh_ and H. Tango
Date of Issue
2007-08
Magazine(name)
JJAP
Volume
Vol. 46_ No. 8A
Page
pp. 5044?5049
ENG
 
ENG
2007
ENG