Academic Theses

Basic information

Name SATOH Toshifumi

Title

Hot-carrier-Induced Degradation of Threshold Voltage under Strong and Weak Current Saturation Stress in p-Channel Low-Temperature Poly-Si TFTs

Summary

 

ENG

ENG

ENG

M. Suganuma_ T. Satoh and H. Tango

Date of Issue

2003-07

Magazine(name)

2003 International Workshop on Active-Matrix Liquid-crystal Displays (AM-LCD 2003)_ Digest of Technical Papers

Volume

0

Page

pp.189-192

ENG

 

ENG

2003

ENG