Hot-carrier-Induced Degradation of Threshold Voltage under Strong and Weak Current Saturation Stress in p-Channel Low-Temperature Poly-Si TFTs

国際会議プロシーディング

M. Suganuma_ T. Satoh and H. Tango

2003/07

2003 International Workshop on Active-Matrix Liquid-crystal Displays (AM-LCD 2003)_ Digest of Technical Papers

0

pp.189-192

2003