Academic Theses

Basic information

Name SATOH Toshifumi

Title

Hot-carrier-induced degradation of threshold voltage in p-channel low- temperaturepoly-Si TFTs

Summary

 

ENG

ENG

ENG

M. Suganuma_ T. Satoh and H. Tango_

Date of Issue

2003-12

Magazine(name)

ELECTRONICS LETTERS_

Volume

Vol.39_ No.25_

Page

pp.1863-1865_

ENG

 

ENG

2003

ENG