Academic Theses
Title
Summary
ENG
ENG
ENG
Date of Issue
Magazine(name)
Volume
Page
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Basic information
Name
SATOH Toshifumi
Title
Hot-carrier-induced degradation of threshold voltage in p-channel low- temperaturepoly-Si TFTs
Summary
 
ENG
ENG
ENG
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M. Suganuma_ T. Satoh and H. Tango_
Date of Issue
2003-12
Magazine(name)
ELECTRONICS LETTERS_
Volume
Vol.39_ No.25_
Page
pp.1863-1865_
ENG
 
ENG
2003
ENG