Academic Theses

Basic information

Name SATOH Toshifumi

Title

Hot-Carrier Degradation and Electric Field near Drain Junction in Low-Temperature N-Vhannel SD (single drain) and LDD Poly-Si TFTs

Summary

 

ENG

ENG

ENG

G. Usami_ Y. Nogami_ T. Yajima_ M. Yamagata_ T. Satoh_ H. Tango

Date of Issue

2006-07

Magazine(name)

The 13th International Workshop on Active-Matrix Flatpanel Displays and Devices

Volume

0

Page

pp.219-222

ENG

 

ENG

2006

ENG