Hot-Carrier Degradation and Electric Field near Drain Junction in Low-Temperature N-Vhannel SD (single drain) and LDD Poly-Si TFTs

国際会議プロシーディング

G. Usami_ Y. Nogami_ T. Yajima_ M. Yamagata_ T. Satoh_ H. Tango

2006/07

The 13th International Workshop on Active-Matrix Flatpanel Displays and Devices

0

pp.219-222

2006