Hot-carrier Degradation and Electric Field Distribution in P-channel Poly-Si TFTs

ENG

M. Suganuma_ Y. Nogami_ T. Satoh_ and H. Tango_

2004-12

Proceedings of Thin Film Materials & Devices Meeting_ Thin Film Materials & Devices Meeting Organizing Committee_ Nara-shi Asunara Conference Hall_

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0

2004