Hot-carrier Degradation and Electric Field Distribution in P-channel Poly-Si TFTs

国際会議プロシーディング

M. Suganuma_ Y. Nogami_ T. Satoh_ and H. Tango_

2004/12

Proceedings of Thin Film Materials & Devices Meeting_ Thin Film Materials & Devices Meeting Organizing Committee_ Nara-shi Asunara Conference Hall_

0

0

2004