Robust Gate Driving Vectors to Load Current and Temperature Variations for Digital Gate Drivers

国際会議プロシーディング

T. Sai, K. Miyazaki, H. Obara, T. Mannen, K. Wada, I. Omura, T. Sakurai, M. Takamiya

2019/09

IEEE IFEEC2019

pp. 87 - 94

2019