Relationship between Hot-Carrier Degradation and Electric Field in Low-Temparature Processed N-Channel Poly-Si TFT

国際会議プロシーディング

G.Usami_ Y.Nogami_ T.Yajima_ T.Satoh and H.Tango

2005/11

Proceedings of The 2nd Thin Film Materials & Devices Meeting

0

pp.40-45

2005