Hot-Carrier Degradation under Current Saturation Stress in Low-Temperature n-Channel LDD Poly-Si TFTs

国際会議プロシーディング

S. Hirata_ M. Yamagata_ T. Satoh_ H. Tango

2007/07

Digest of Technical papers The 14th International Workshop on Active-Matrix Flatpanel Displays and Devices

0

pp. 179-182

2007