Other

Basic information

Name CHEN Jun

Start Date

2019-10-23

End Date

2019-10-23

ENG

ENG

Matter

Phase-shifting interference microscopy for high-precision measurement of small phase objects

Summary

 

ENG

Photonics Asia 2019, Hangzhou International Expo Center, Hangzhou, China

ENG

J. Chen, M. Toyoda, and J. Endo

ENG

 

ENG

中国

ENG

SPIE

ENG

2019

ENG