Other
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2009-09
ENG
High-Temperature X-Ray Reflectivity (XRR) And X-Ray Diffraction (XRD) As Novel Thermal Analyses: Application To Organic Light-Emitting Thin Films
37th North American Thermal Analysis Society (NATAS) Conference (Texas Tec Univ/) abstract pp/236
Meihan Wang、 Takayuki Konya、 Yutaka Sawada、 Takayuki Uchida、 Hao Leiand Yoichi Hoshi
Lubbock、 Texas、 USA
2009
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