High-Temperature X-Ray Reflectivity (XRR) And X-Ray Diffraction (XRD) As Novel Thermal Analyses: Application To Organic Light-Emitting Thin Films

ENG

Meihan Wang_ Takayuki Konya_ Yutaka Sawada_ Takayuki Uchida_ Hao Leiand Yoichi Hoshi

2009-09

37th North American Thermal Analysis Society (NATAS) Conference; Proceedings [CD-ROM version]

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0

2009