2003-04

ENG

Hot-carrier-Induced Degradation of Threshold Voltage under Strong and Weak Current Saturation Stress in p-Channel Low-Temperature Poly-Si TFTs

2003 International Workshop on Active-Matrix Liquid-crystal Displays (AM-LCD 2003) Digest of Technical Papers

M. Suganuma、 T. Satoh and H. Tango

2003