Stress-Induced Off-Current under On- and Off-State Stress Voltages in Low-Temperature n-Channel Polycrystalline Silicon Thin-Film Transistors

ENG

Seishiro Hirata_ Toshifumi Satoh_ Hiroyuki Tango

2010-03

Jpn. J. Appl. Phys.

0

03CA05 1-6

2009